Rice: ECE Affiliates Meeting 2005


	Kartik Mohanram ECE Assistant Professor Rice University

	Defects and Faults: Nemesis or Opportunity? Part 1
	Basic extrapolations from the International Technology Roadmap for Semiconductors indicate that manufacturing defects and transient faults -- in both devices and interconnect -- will emerge as the primary showstopper to achieving increased performance and reliability in extremely-scaled silicon and emerging technology alternatives. Hear about the challenges and some of our current research efforts across the design hierarchy at the device/interconnect level. This discussion is covered in-depth during the Computer Engineering technical session.
	Tuesday, September 20, 2005 2:15p.m. - Duncan Hall, McMurtry Auditorium Rice University
	* Biography: Kartik Mohanram received his BS in 1998 from the Indian Institute of Technology, Bombay and PhD in 2003 from the University of Texas at Austin, both in Electrical Engineering. He was a member of CATLAB (Computer-Aided Test Lab). Mohanram served on the ACM/SIGDA Programming Contest at the International Conference on Computer-Aided Design (ICCAD) -- CACAthlon 2004 organizing committee, and the organizing committee for the annual PhD Forum at the Design Automation Conference. His interests include the development of methodologies for the costeffective incorporation of concurrent error detection circuitry in integrated circuits.

ECE Affiliates Meeting - Morning Session

Last modified: September 26, 2005

Kartik Mohanram