Organic materials such as carbon nanotubes and conducting polymers offer the promise of smaller, cheaper, and faster electronic devices. To realize their potential, our ability to controlably build and measure these devices and their underlying components must increase. One tool that is particularly well suited to meeting the challenge of imaging these nanostructures is scanning tunneling microscopy (STM). My talk will highlight recent STM investigations into the structural and electrical properties of these new electronic materials as well as its use in measuring traditional semiconductors on the nanometer scale. I will also discuss the use of self-assembly techniques in combination with STM to study candidate molecules for next generation single molecule electronic devices. Lastly, I will present details on future experiments with regard to these materials.
9:45 am
McMurtry Auditorium, Duncan Hall 1055
For additional information, contact:
Last Updated: September 22, 2002